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DTSTAMP:20250822T115808Z
LOCATION:Room 5.2A17
DTSTART;TZID=Europe/Stockholm:20250617T113000
DTEND;TZID=Europe/Stockholm:20250617T133000
UID:submissions.pasc-conference.org_PASC25_sess111@linklings.com
SUMMARY:MS3E - Ptychographic X-Ray Tomography for Nondestructive Imaging o
 f Complex Nanoscale Structure
DESCRIPTION:Ptychographic x-ray tomography is the highest resolution x-ray
  imaging technique available for generic samples, achieving resolutions do
 wn to 4 nm. Since its development at the Paul Scherrer Institute in 2010, 
 it has been applied to a wide variety of systems, with applications in cat
 alysis, materials science, engineering, the life sciences, and physics. Th
 e field as a whole is currently facing a major opportunity, combined with 
 a major challenge because synchrotrons around the world, including the Swi
 ss Light Source, are upgrading to fourth-generation storage rings. These n
 ew synchrotrons provide far higher brightness and massively increased data
  rates, making it possible to study larger systems but also brings computa
 tional challenges related to dealing with the ever-growing data rates. Thi
 s minisymposium includes talks from experts on ptychographic tomography re
 constructions who work in different fields, and who champion different app
 roaches to making use of these new, brighter sources. By including perspec
 tives from a variety of application areas, with a shared focus on the chal
 lenge of managing data rates, we hope to drive forward the conversation an
 d identify the most promising approaches for the next generation of beamli
 nes and reconstruction tools.\n\nHigh Speed Ptychographic Tomography\n\nX-
 ray ptychographic tomography is now routinely used at synchrotron faciliti
 es around the world, producing nanoscale resolutions in 3D. However, the a
 cquisition times still lag significantly behind other imaging methods. As 
 many synchrotrons upgrade to diffraction limited rings, the community is b
 ei...\n\n\nDarren Batey (Diamond Light Source)\n---------------------\n3D 
 Lensless X-ray Imaging of Microchips at 4 nm Resolution\n\nAs transistor d
 imensions have progressively shrunk over the years, X-ray microscopy resol
 ution has also continued to improve to meet the demands of the semiconduct
 or industry. Although electron microscopy can achieve higher imaging resol
 utions, X-rays offer unique advantages, including non-destructi...\n\n\nTo
 mas Aidukas (Paul Scherrer Institute)\n---------------------\nPtychography
  with Extreme Data\n\nX-ray microscopy via ptychographic imaging has been 
 growing rapidly in the last decade. Where early experiments could only be 
 performed by a few experts groups with their own specialized software impl
 ementations. Nowadays ptychographic experiments can be performed at plenty
  of beamlines and various ...\n\n\nMaik Kahnt (MAX IV Laboratory, Lund Uni
 versity)\n---------------------\nCoherent X-ray Imaging Data Analysis Usin
 g PyNX\n\n4th generation synchrotron sources provide two orders of magnitu
 de more coherent photons, and thus the ability to collect coherent X-ray i
 maging datasets faster and/or with a higher resolution. Consequently, the 
 increased volume of data requires dedicated tools to fully take advantage 
 of the improve...\n\n\nVincent FAVRE-NICOLIN (ESRF, Univ. Grenoble Alpes)\
 n\nDomain: Chemistry and Materials, Engineering, Life Sciences, Physics, C
 omputational Methods and Applied Mathematics\n\nSession Chair: Abraham Lev
 itan (Paul Scherrer Institute)
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